Blogs

Introduction Semiconductor wafer manufacturing employs grinding processes that generate substantial quantities of abrasive slurry containing suspended silicon and abrasive particles. Effective management of these waste streams requires continuous suspended solids (SS) monitoring to optimize filtration systems, minimize waste generation, and maintain process quality. Grinding slurry recycle and filtration streams commonly run at suspended solids concentrations…

Turbidity — the optical measurement of water clarity — is one of the oldest water quality parameters, and it is still one of the most useful for electronics manufacturing water systems. It signals suspended particle contamination, membrane breakthrough and treatment upsets. As device geometries shrink, the particle budgets that wet processes can tolerate get tighter,…

Introduction Chemical oxygen demand (COD) measurement is how semiconductor fabs prove their wastewater is fit to discharge—and keep proving it, continuously, as permits tighten. Continuous COD monitoring enables facilities to maintain compliance while optimizing treatment performance and minimizing operating cost. Discharge permits—NPDES permits in the US, and equivalent frameworks elsewhere—typically set COD limits in the…

Introduction Oil contamination in pure water systems poses real risks to electronics manufacturing quality and equipment reliability. Even trace hydrocarbon contamination can compromise semiconductor device performance, shorten equipment component life, and trigger costly production interruptions. As device geometries shrink and reliability requirements tighten, oil-in-water monitoring matters more, not less. No reliable industry-wide figure exists for…